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It is the semiconductor substrate which has

机译:正是具有

摘要

PROBLEM TO BE SOLVED: To suppress the generation of side etching in dry etching.;SOLUTION: A semiconductor substrate having a mask for forming grooves in a region for forming a semiconductor element on one side of a semiconductor film and an insulation film on the other side of the semiconductor film is placed on the lower electrode of the dry etching device so that a surface with the mask may be a processed surface; the outer periphery of the semiconductor substrate is pressed with a metallic clamp to be the potential substantially the same as that of the lower electrode; dry etching using the insulation film as an etching stopper layer is started; and the region and the clamp are brought into an electrically insulation state after at least the bottom surface of the grooves formed around the region reaches the insulation film.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:在干法蚀刻中抑制侧面蚀刻的产生。解决方案:一种半导体衬底,该半导体衬底具有用于在半导体膜的一侧上形成半导体元件并且在另一侧上形成绝缘膜的区域中形成凹槽的掩模。半导体膜的一面被放置在干蚀刻装置的下部电极上,使得具有掩模的表面可以是被处理的表面。用金属夹将半导体基板的外周压成与下部电极大致相同的电位。开始使用绝缘膜作为蚀刻停止层的干法蚀刻。至少在该区域周围形成的凹槽的底面到达绝缘膜之后,该区域和夹具进入电绝缘状态。;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP5407276B2

    专利类型

  • 公开/公告日2014-02-05

    原文格式PDF

  • 申请/专利权人 大日本印刷株式会社;

    申请/专利号JP20080275832

  • 发明设计人 小澤 裕;

    申请日2008-10-27

  • 分类号H01L21/3065;H01L21/683;

  • 国家 JP

  • 入库时间 2022-08-21 16:11:01

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