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METHOD AND SYSTEM FOR A HIGH-DENSITY, LOW-COST, CMOS COMPATIBLE MEMORY

机译:高密度,低成本,CMOS兼容存储器的方法和系统

摘要

Methods and systems for a high-density, low-cost, CMOS compatible memory may comprise a memory cell on a chip, the memory cell comprising: a plurality of capacitor/switch pairs, where for each pair comprising a switch and a capacitor, a source terminal of the switch is coupled to a gate terminal of the capacitor. The memory cell may also comprise a reset transistor, a biasing circuit, and a source follower. A drain terminal of each switch may be coupled to a floating node that couples a source terminal of the reset transistor and a gate terminal of the source follower. Drain and source terminals of each of the switches of the plurality of capacitor/switch pairs may be coupled to ground. A number of the plurality of capacitor/switch pairs may indicate a number of bits in the memory. The biasing circuit may comprise a current mirror. A bit-line for the memory cell may be coupled to a source terminal of the source follower. The bit-line may comprise a metal trace.
机译:用于高密度,低成本,CMOS兼容存储器的方法和系统可以包括芯片上的存储器单元,该存储器单元包括:多个电容器/开关对,其中对于每对包括开关和电容器,开关的源极端子耦合到电容器的栅极端子。该存储单元还可以包括复位晶体管,偏置电路和源极跟随器。每个开关的漏极端子可以耦合到浮动节点,该浮动节点耦合复位晶体管的源极端子和源极跟随器的栅极端子。多个电容器/开关对的每个开关的漏极和源极端子可以接地。多个电容器/开关对的数量可以指示存储器中的位数。偏置电路可以包括电流镜。用于存储单元的位线可以耦合到源极跟随器的源极端子。位线可以包括金属迹线。

著录项

  • 公开/公告号US2014301133A1

    专利类型

  • 公开/公告日2014-10-09

    原文格式PDF

  • 申请/专利权人 MAXLINEAR INC.;

    申请/专利号US201414244327

  • 发明设计人 KIMIHIKO IMURA;JIANPING YANG;

    申请日2014-04-03

  • 分类号G11C11/24;

  • 国家 US

  • 入库时间 2022-08-21 16:06:43

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