首页> 外国专利> Metal-Gate MOS Transistor and Method of Forming the Transistor with Reduced Gate-to-Source and Gate-to-Drain Overlap Capacitance

Metal-Gate MOS Transistor and Method of Forming the Transistor with Reduced Gate-to-Source and Gate-to-Drain Overlap Capacitance

机译:金属门MOS晶体管及形成具有减小的栅极到源极和栅极到漏极的重叠电容的晶体管的方法

摘要

The gate-to-source and gate-to-drain overlap capacitance of a MOS transistor with a metal gate and a high-k gate dielectric are reduced by forming the high-k gate dielectric along the inside of a sidewall structure which has been formed to lie further away from the source and the drain.
机译:通过沿着已形成的侧壁结构的内部形成高k栅极电介质,可以降低具有金属栅极和高k栅极电介质的MOS晶体管的栅极到源极和栅极到漏极的重叠电容远离源头和漏极。

著录项

  • 公开/公告号US2014124874A1

    专利类型

  • 公开/公告日2014-05-08

    原文格式PDF

  • 申请/专利权人 TEXAS INSTRUMENTS INCORPORATED;

    申请/专利号US201213671730

  • 发明设计人 MANOJ MEHROTRA;HIROAKI NIIMI;

    申请日2012-11-08

  • 分类号H01L29/78;H01L21/336;

  • 国家 US

  • 入库时间 2022-08-21 16:04:36

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号