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Semiconductor device having gate structures to reduce the short channel effects

机译:具有栅极结构以减少短沟道效应的半导体器件

摘要

A semiconductor device comprises a semiconductor substrate on an insulating layer; and a second gate that is located on the insulating layer and is embedded at least partially in the semiconductor substrate. A method for forming a semiconductor device comprises: forming a semiconductor substrate on an insulating layer; forming a void within the semiconductor substrate, with the insulating layer being exposed by the void; and forming a second gate, with the void being filled with at least one part of the second gate. It facilitates the reduction of the short channel effects, resistances of the source and drain regions, and parasitic capacitances.
机译:一种半导体装置,其特征在于,在绝缘层上具有半导体基板。第二栅极位于绝缘层上并且至少部分地嵌入半导体衬底中。用于形成半导体器件的方法包括:在绝缘层上形成半导体衬底;以及在绝缘层上形成半导体衬底。在半导体衬底内形成空隙,绝缘层被该空隙暴露;形成第二栅极,该空隙填充有第二栅极的至少一部分。它有助于减少短沟道效应,源极和漏极区域的电阻以及寄生电容。

著录项

  • 公开/公告号US8816392B2

    专利类型

  • 公开/公告日2014-08-26

    原文格式PDF

  • 申请/专利权人 HUILONG ZHU;QINGQING LIANG;

    申请/专利号US201113121998

  • 发明设计人 HUILONG ZHU;QINGQING LIANG;

    申请日2011-03-02

  • 分类号H01L29/66;H01L33;H01L21/02;

  • 国家 US

  • 入库时间 2022-08-21 16:04:19

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