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Memory unit and method of operating the same

机译:存储器单元及其操作方法

摘要

A memory unit includes memory elements and a drive section. In executing a first operation out of the first operation for changing resistance state of the memory element from one resistance state out of low resistance state and high resistance state to the other resistance state and a second operation for changing the resistance state of the memory element from the other resistance state to the one resistance state, the drive section performs stepwise operation, in which the drive section repeatedly performs, at least one time, a step in which strong stress application step for applying a stress for performing the first operation to the memory element as the drive target relatively strongly is performed and subsequently weak stress application step for applying a stress for performing the second operation to the memory element as the drive target relatively weakly is performed, and subsequently performs the strong stress application step.
机译:存储单元包括存储元件和驱动部分。在执行用于将存储元件的电阻状态从低电阻状态和高电阻状态中的一个电阻状态改变为另一电阻状态的第一操作中的第一操作以及用于将存储元件的电阻状态从第二电阻改变为第二操作的第二操作中从另一电阻状态到一个电阻状态,驱动部分执行逐步操作,其中驱动部分至少重复执行一次步骤,在该步骤中,强应力施加步骤用于向存储器施加执行第一操作的应力相对于驱动目标相对较弱地执行存储元件,然后对作为较弱的驱动目标向存储元件施加用于执行第二操作的应力的较弱的应力施加步骤,并随后执行较强的应力施加步骤。

著录项

  • 公开/公告号US8693234B2

    专利类型

  • 公开/公告日2014-04-08

    原文格式PDF

  • 申请/专利权人 MOTONARI HONDA;

    申请/专利号US201213363988

  • 发明设计人 MOTONARI HONDA;

    申请日2012-02-01

  • 分类号G11C11/00;

  • 国家 US

  • 入库时间 2022-08-21 15:59:28

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