首页> 外国专利> Non-volatile resistive memory devices with boosting capacitor and methods for biasing resistive memory structures thereof

Non-volatile resistive memory devices with boosting capacitor and methods for biasing resistive memory structures thereof

机译:具有升压电容器的非易失性电阻存储器件及其偏置电阻存储结构的方法

摘要

Non-volatile resistive memory device comprising memory cells and bit, word, source and form lines for addressing and biasing the memory cells, a memory controller for applying voltages to said lines, each of the memory cells comprising a cell selecting transistor, a resistive memory structure serially connected to a drain-source path of the cell selecting transistor, the resistive memory structure and the cell selecting transistor together forming a conductive path between the bit lines and the source lines and the gate of the cell selecting transistor being connected to the word lines and a boosting capacitor connected between the form lines and an internal node of the memory cell at a connection between the resistive memory structure and the cell selecting transistor, said boosting capacitor being configured for boosting a voltage on said internal node. The invention also relates to a method for biasing such resistive memory device.
机译:非易失性电阻式存储设备,包括存储单元以及用于寻址和偏置存储单元的位线,字线,源极线和形成线,用于向所述线施加电压的存储控制器,每个存储单元包括单元选择晶体管,电阻式存储器串联连接到单元选择晶体管的漏极-源极路径的结构,电阻存储结构和单元选择晶体管一起形成位线和源极线之间的导电路径,并且单元选择晶体管的栅极连接到字电阻线结构和单元选择晶体管之间的连接处的连接线和在存储单元的内部节点之间形成的线和升压电容器,所述升压电容器被配置为对所述内部节点上的电压进行升压。本发明还涉及一种用于偏置这种电阻存储器件的方法。

著录项

  • 公开/公告号EP2713372A1

    专利类型

  • 公开/公告日2014-04-02

    原文格式PDF

  • 申请/专利权人 IMEC;

    申请/专利号EP20120186669

  • 发明设计人 COSEMANS STEFAN;

    申请日2012-09-28

  • 分类号G11C13;H01L27/24;

  • 国家 EP

  • 入库时间 2022-08-21 15:46:10

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