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METHOD OF FABRICATING N-TYPE SEMICONDUCTOR USING N-DOPED REDUCED GRAPHENE OXIDE

机译:用N掺杂还原氧化石墨烯制备N型半导体的方法

摘要

According to an embodiment of the present invention, nitrogen-doped reduced graphene oxide (N-doped rGO) and a method of fabricating n-type semiconductor using the same comprise: a step for creating a graphene oxide (GO); a step for creating partially reduced graphene oxide (PrGO-IL) by reacting the graphene oxide (GO) and ionic liquid to an organic solvent; a step for applying the partially reduced graphene oxide (PrGO-IL) to a substrate by a spin-coating method; and a step for creating N-doped rGO by annealing the applied PrGO-IL. Therefore, n-type semiconductor can be manufactured using N-doped rGO, and application to complementary circuit is possible by integrating with ordinary p-type graphene.
机译:根据本发明的实施例,氮掺杂的还原氧化石墨烯(N掺杂的rGO)和使用其制造n型半导体的方法包括:生成氧化石墨烯(GO)的步骤;通过使氧化石墨烯(GO)和离子液体与有机溶剂反应生成部分还原的氧化石墨烯(PrGO-IL)的步骤;通过旋涂法将部分还原的氧化石墨烯(PrGO-IL)涂覆到基板上的步骤;通过退火所施加的PrGO-IL来产生N掺杂rGO的步骤。因此,可以使用N掺杂的rGO来制造n型半导体,并且可以通过与普通的p型石墨烯集成而应用于互补电路。

著录项

  • 公开/公告号KR20140118282A

    专利类型

  • 公开/公告日2014-10-08

    原文格式PDF

  • 申请/专利权人 INTELLECTUAL DISCOVERY CO. LTD.;

    申请/专利号KR20130033906

  • 发明设计人 LEE HYO YOUNG;

    申请日2013-03-28

  • 分类号H01L21/336;H01L29/78;B82B3;

  • 国家 KR

  • 入库时间 2022-08-21 15:42:02

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