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bump-on-trace-link structure for flip-chip housings
bump-on-trace-link structure for flip-chip housings
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机译:倒装芯片外壳的跟踪凸点链接结构
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摘要
A bump-on-trace-link structure, the a soldered contact with a lower volume, in order to achieve a conductive metal column and to connect a metal conductor, comprises a conductive metal column, which is a bond-surface having a width wP , and a metal conductor, which is connected to a housing-substrate is provided, and an upper surface having a width wT , where wP greater than wT is. The solder contact is bonded to the bond-surface in that, by means of the width wP , and is mainly is wetted only at the upper surface of the bonded metal conductor train, in that predominantly only the upper surface over the width wT is wetted.
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机译:为了实现导电金属柱并连接金属导体,具有较小体积的焊接触点的迹线连接凸点结构包括导电金属柱,该导电金属柱是宽度为w的接合面提供 P Sub>,并提供连接到壳体基板的金属导体,以及具有宽度w T Sub>的上表面,其中w P Sub>大于w T Sub>。焊点通过宽度w P Sub>粘结到粘结表面,并且主要仅在粘结的金属导体列的上表面润湿,主要是宽度w T Sub>的上表面被润湿。
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