首页> 外国专利> METHOD FOR CLEANING DEVICE FOR FORMING SILICON OXIDE FILM, METHOD FOR FORMING SILICON OXIDE FILM, AND DEVICE FOR FORMING SILICON OXIDE FILM

METHOD FOR CLEANING DEVICE FOR FORMING SILICON OXIDE FILM, METHOD FOR FORMING SILICON OXIDE FILM, AND DEVICE FOR FORMING SILICON OXIDE FILM

机译:形成氧化硅膜的清洁设备的方法,形成氧化硅膜的方法和形成氧化硅膜的设备

摘要

PROBLEM TO BE SOLVED: To provide a method for cleaning a device for forming a silicon oxide film, a method for forming a silicon oxide film, and a device for forming a silicon oxide film, which are capable of suppressing the occurrence of particles and improving productivity, even in a low temperature such as RT.;SOLUTION: A method for cleaning a device for forming a silicon oxide film includes an oxidation step and a cleaning step. In the oxidation step, oxidation gas is supplied into a reaction chamber to oxidize deposit attached to the inside of the device. In the cleaning step, cleaning gas is supplied into the reaction chamber and the deposit oxidized in the oxidation step is removed to clean the inside of the device for forming a silicon oxide film.;COPYRIGHT: (C)2016,JPO&INPIT
机译:解决的问题:提供一种能够抑制颗粒的出现并改善其性能的用于清洁用于形成氧化硅膜的装置的方法,用于形成氧化硅膜的方法以及用于形成氧化硅膜的装置。解决方案:用于清洁形成氧化硅膜的装置的方法包括氧化步骤和清洁步骤。在氧化步骤中,将氧化气体供应到反应室中,以氧化附着在装置内部的沉积物。在清洁步骤中,将清洁气体供应到反应室中,并去除在氧化步骤中被氧化的沉积物,以清洁用于形成氧化硅膜的装置的内部.COPYRIGHT:(C)2016,JPO&INPIT

著录项

  • 公开/公告号JP2015185565A

    专利类型

  • 公开/公告日2015-10-22

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LTD;

    申请/专利号JP20140058129

  • 申请日2014-03-20

  • 分类号H01L21/316;H01L21/3065;H01L21/31;

  • 国家 JP

  • 入库时间 2022-08-21 15:35:19

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