首页> 外国专利> METHOD OF FORMING EPITAXIAL FILM HAVING DEFECT-FREE REGION ON SUBSTRATE, AND SUBSTRATE WITH EPITAXIAL FILM HAVING DEFECT-FREE REGION

METHOD OF FORMING EPITAXIAL FILM HAVING DEFECT-FREE REGION ON SUBSTRATE, AND SUBSTRATE WITH EPITAXIAL FILM HAVING DEFECT-FREE REGION

机译:在基质上形成无缺陷区域的膜的方法,以及在基质上形成具有无缺陷区域的膜的方法

摘要

PROBLEM TO BE SOLVED: To solve such a problem that when forming an epitaxial film of a harder material than a relatively soft substrate, e.g., a metal substrate, on the substrate, a stress due to lattice matching therebetween causes a defect on the substrate side, and it appears as the defect of the epitaxial film.;SOLUTION: After forming an extremely shallow trench on the substrate surface, epitaxial growth is performed on that surface. Since a stress due to lattice matching is released in the trench and is not propagated nor stored over the entire substrate surface, when an arbitrary region on the substrate surface is isolated from the stress remotely by the trench, the defect is never formed in that region.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:为了解决这样的问题,当在基板上形成比金属​​基板等相对较软的基板例如硬质材料的外延膜时,由于晶格匹配导致的应力在基板侧产生缺陷。解决方案:在衬底表面上形成非常浅的沟槽后,在该表面上进行外延生长。由于晶格匹配所产生的应力在沟槽中释放,并且不会在整个基板表面上传播或存储,因此,当基板表面上的任意区域与沟槽之间的应力使远程隔离时,就不会在该区域中形成缺陷。 。;版权:(C)2015,JPO&INPIT

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