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Process for thinning the active silicon layer of a substrate of “silicon on insulator” (SOI) type

机译:减薄“绝缘体上硅”(SOI)型衬底的有源硅层的工艺

摘要

The invention relates to a process for thinning the active silicon layer of a substrate, which comprises an insulator layer between the active layer and a support, this process comprising one step of sacrificial thinning of active layer by formation of a sacrificial oxide layer by sacrificial thermal oxidation and deoxidation of the sacrificial oxide layer. The process is noteworthy in that it comprises: a step of forming a complementary oxide layer on the active layer, using an oxidizing plasma, this layer having a thickness profile complementary to that of oxide layer, so that the sum of the thicknesses of the oxide layer and of the sacrificial silicon oxide layer are constant over the surface of the treated substrate, a step of deoxidation of this oxide layer, so as to thin active layer by a uniform thickness.
机译:本发明涉及一种用于减薄衬底的有源硅层的方法,该衬底包括在有源层和支撑件之间的绝缘体层,该方法包括通过牺牲热形成牺牲氧化物层来牺牲性地减薄有源层的步骤。牺牲氧化物层的氧化和脱氧。该过程值得注意,因为它包括:使用氧化等离子体在有源层上形成互补氧化物层的步骤,该层的厚度轮廓与氧化物层的厚度轮廓互补,使得氧化物的厚度之和在该处理过的衬底的表面上,氧化硅层和牺牲氧化硅层是恒定的,这是该氧化层的脱氧步骤,以便以均匀的厚度使有源层变薄。

著录项

  • 公开/公告号US9082819B2

    专利类型

  • 公开/公告日2015-07-14

    原文格式PDF

  • 申请/专利权人 SOITEC;

    申请/专利号US201314382738

  • 发明设计人 SEBASTIEN KERDILES;FRANCOIS BOEDT;

    申请日2013-01-30

  • 分类号H01L21/84;H01L21/02;H01L21/762;H01L21/66;H01L21/306;

  • 国家 US

  • 入库时间 2022-08-21 15:20:50

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