首页> 外国专利> III-nitride enhancement mode transistors with tunable and high gate-source voltage rating

III-nitride enhancement mode transistors with tunable and high gate-source voltage rating

机译:具有可调和高栅极-源极额定电压的III氮化物增强模式晶体管

摘要

A semiconductor device includes an enhancement mode GaN FET with a depletion mode GaN FET electrically coupled in series between a gate node of the enhancement mode GaN FET and a gate terminal of the semiconductor device. A gate node of the depletion mode GaN FET is electrically coupled to a source node of the enhancement mode GaN FET. A source node of said enhancement mode GaN FET is electrically coupled to a source terminal of the semiconductor device, a drain node of the enhancement mode GaN FET is electrically coupled to a drain terminal of said semiconductor device, and a drain node of the depletion mode GaN FET is electrically coupled to a gate terminal of the semiconductor device.
机译:半导体器件包括具有耗尽型GaN FET的增强型GaN FET,该耗尽型GaN FET串联电耦合在增强型GaN FET的栅极节点和半导体器件的栅极端子之间。耗尽型GaN FET的栅极节点电耦合至增强型GaN FET的源极节点。所述增强模式GaN FET的源极节点电耦合至半导体器件的源极端子,增强模式GaN FET的漏极节点电耦合至所述半导体器件的漏极端,并且耗尽模式的漏极节点GaN FET电耦合到半导体器件的栅极端子。

著录项

  • 公开/公告号US8933461B2

    专利类型

  • 公开/公告日2015-01-13

    原文格式PDF

  • 申请/专利权人 TEXAS INSTRUMENTS INCORPORATED;

    申请/专利号US201313886410

  • 发明设计人 SAMEER PENDHARKAR;NAVEEN TIPIRNENI;

    申请日2013-05-03

  • 分类号H01L31/0256;H01L21/336;H01L29/20;H01L29/66;H01L29/778;H01L21/8252;H01L21/8258;H01L27/06;H01L29/423;H01L29/10;

  • 国家 US

  • 入库时间 2022-08-21 15:19:29

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号