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Output control scan flip-flop, semiconductor integrated circuit including the same, and design method for semiconductor integrated circuit
Output control scan flip-flop, semiconductor integrated circuit including the same, and design method for semiconductor integrated circuit
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机译:输出控制扫描触发器,包括该触发器的半导体集成电路以及半导体集成电路的设计方法
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摘要
An output control scan flip-flop according to the present invention includes a first scan flip-flop that captures first data in a first mode and second data in a second mode in synchronization with a clock signal to output the data that is captured, a second scan flip-flop that captures the data output from the first scan flip-flop in the second mode in synchronization with a clock signal to output the data that is captured, and a gating circuit that generates the data output from the first scan flip-flop in the first mode as output data, and generates output data having a change rate of a logic value lower than a change rate of a logic value of the data output from the first scan flip-flop based on the data output from each of the first scan flip-flop and the second scan flip-flop in the second mode.
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