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Information theoretic and spectral methods of test point, partial-scan and full-scan flip-flop insertion to improve integrated circuit testability

机译：测试点，部分扫描和全扫描触发器插入的信息理论和频谱方法，以提高集成电路的可测试性

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作者
Ausoori, Raghuveer;
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作者单位

Rutgers The State University of New Jersey - New Brunswick;

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授予单位 Rutgers The State University of New Jersey - New Brunswick;
学科
学位 M.S.
年度 2009
页码 147 p.
总页数 147
原文格式 PDF
正文语种 eng
中图分类
关键词
入库时间 2022-08-17 11:59:54

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专利

1. Test Strength: A Quality Metric for Transition Fault Tests in Full-Scan Circuits [J] . Pomeranz I., Reddy S. M. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on . 2011,第10期

机译：测试强度：全扫描电路中过渡故障测试的质量指标
2. Broadside and Functional Broadside Tests for Partial-Scan Circuits [J] . Pomeranz I., Reddy S. M. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on . 2011,第6期

机译：局部扫描电路的宽带测试和功能宽带测试
3. Partial-scan delay fault testing of asynchronous circuits [J] . Kishinevsky M., Kondratyev A. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems . 1998,第11期

机译：异步电路的部分扫描延迟故障测试
4. Timing-driven test point insertion for full-scan and partial-scan BIST [C] . Kwan-Ting Cheng, Chih-Jen Lin . 1995

机译：定时驱动的测试点插入，用于全扫描和部分扫描BIST
5. SPARTAN: A spectral and entropy-based partial-scan and test point insertion algorithm. [D] . Khan, Omar I. 2007

机译：SPARTAN：一种基于频谱和熵的部分扫描和测试点插入算法。
6. Integrated displays to improve chronic disease management in ambulatory care: A SMART on FHIR application informed by mixed-methods user testing [O] . Rebecca L Curran, Polina V Kukhareva, Teresa Taft, 2020

机译：集成显示器提高车身护理中的慢性疾病管理：通过混合方法用户测试了解FHIR应用程序的智能应用
7. Partial-scan delay fault testing of asynchronous circuits [O] . Michael Kishinevsky, Alex Kondratyev, Luciano Lavagno, 1998

机译：异步电路的部分扫描延迟故障测试
8. Semiconductor Measurement Technology: Test Structure Implementation Document: DCParametric Test Structures and Test Methods for Monolithic Microwave Integrated Circuits (MMICs) [R] . Schuster, C. E. 1995

机译：半导体测量技术：测试结构实施文档：单片微波集成电路（mmIC）的直流参数测试结构和测试方法

Information theoretic and spectral methods of test point, partial-scan and full-scan flip-flop insertion to improve integrated circuit testability

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