首页> 外国专利> Semiconductor device with flash memory cells having improved arrangement for floating gate electrodes and control gate electrodes of the flash memory cells

Semiconductor device with flash memory cells having improved arrangement for floating gate electrodes and control gate electrodes of the flash memory cells

机译:具有具有改进的用于闪存单元的浮栅电极和控制栅电极的布置的闪存单元的半导体器件

摘要

A semiconductor device having a nonvolatile memory is reduced in size. In an AND type flash memory having a plurality of nonvolatile memory cells having a plurality of first electrodes, a plurality of word lines crossing therewith, and a plurality of floating gate electrodes disposed at positions which respectively lie between the plurality of adjacent first electrodes and overlap the plurality of word lines, as seen in plan view, the plurality of floating gate electrodes are formed in a convex shape, as seen in cross section, so as to be higher than the first electrodes. As a result, even when nonvolatile memory cells are reduced in size, it is possible to process the floating gate electrodes with ease. In addition, it is possible to improve the coupling ratio between floating gate electrodes and control gate electrodes of the word lines without increasing the area occupied by the nonvolatile memory cells.
机译:具有非易失性存储器的半导体器件尺寸减小。在具有多个具有多个第一电极的非易失性存储单元的AND型闪存中,多个字线与之交叉,并且多个浮置栅电极设置在分别位于多个相邻的第一电极之间并且重叠的位置处在俯视时,多条字线以比第一电极高的截面形成为凸状。结果,即使当减小非易失性存储单元的尺寸时,也可以容易地处理浮栅电极。另外,可以在不增加非易失性存储单元占用的面积的情况下提高字线的浮置栅电极与控制栅电极之间的耦合比。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号