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A PROCESS FOR THE MANUFACTURE OF SEMICONDUCTOR DEVICES COMPRISING THE CHEMICAL MECHANICAL POLISHING OF ELEMENTAL GERMANIUM AND/OR SISB1 X/SBGESBX/SB MATERIAL IN THE PRESENCE OF A CMP COMPOSITION HAVING A PH VALUE OF 3.0 TO 5.5
A PROCESS FOR THE MANUFACTURE OF SEMICONDUCTOR DEVICES COMPRISING THE CHEMICAL MECHANICAL POLISHING OF ELEMENTAL GERMANIUM AND/OR SISB1 X/SBGESBX/SB MATERIAL IN THE PRESENCE OF A CMP COMPOSITION HAVING A PH VALUE OF 3.0 TO 5.5
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机译:具有pH值的CMP组成的含锗元素和/或SI 1 X SB> GE X SB>材料的化学机械抛光的半导体器件的制造过程从3.0到5.5
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摘要
1 xxA process for the manufacture of semiconductor devices comprising the chemical mechanical polishing of elemental germanium and/or SiGe material with 0.1 = x 1 in the presence of a chemical mechanical polishing (CMP) composition having a pH value in the range of from 3.0 to 5.5 and comprising: (A) inorganic particles organic particles or a mixture or composite thereof (B) at least one type of an oxidizing agent and (C) an aqueous medium.
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机译:1 xxA的制造半导体器件的方法,包括在pH值范围为3.0的化学机械抛光(CMP)组合物存在下,对元素锗和/或SiGe材料进行化学机械抛光,其中元素锗和/或SiGe材料的含量为0.1 = x <1到5.5,包括:(A)无机颗粒,有机颗粒或其混合物或复合物(B)至少一种氧化剂和(C)水性介质。
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