首页> 外国专利> METHOD FOR FORMING OXIDE THIN FILM AND METHOD FOR FABRICATING OXIDE THIN FILM TRANSISTOR PERFORMING CHANNEL DOPING AND PASSIVATION SIMULTANEOUSLY

METHOD FOR FORMING OXIDE THIN FILM AND METHOD FOR FABRICATING OXIDE THIN FILM TRANSISTOR PERFORMING CHANNEL DOPING AND PASSIVATION SIMULTANEOUSLY

机译:形成氧化物薄膜的方法和制造氧化物薄膜晶体管的方法同时进行通道的掺杂和钝化

摘要

The present invention relates to a method for forming an oxide thin film and a method for fabricating an oxide thin film transistor and, more specifically, to a method for forming an oxide thin film and a method for fabricating an oxide thin film transistor performing channel doping and passivation at the same time. The method for forming an oxide thin film according to an embodiment of the present invention can comprise the following steps of: forming a first oxide thin film containing indium; forming a second oxide thin film containing at least one among aluminum, zirconium, and hafnium on the first oxide thin film; and performing a heat treatment for the first and second oxide thin films.;COPYRIGHT KIPO 2015
机译:氧化物薄膜的形成方法及氧化物薄膜晶体管的制造方法技术领域本发明涉及氧化物薄膜的形成方法及氧化物薄膜晶体管的制造方法,尤其涉及进行沟道掺杂的氧化物薄膜的形成方法及氧化物薄膜晶体管的制造方法。和钝化同时进行。根据本发明的实施方式的形成氧化物薄膜的方法可以包括以下步骤:形成包含铟的第一氧化物薄膜;以及形成包含铟的第一氧化物薄膜。在第一氧化物薄膜上形成包含铝,锆和ha中的至少一种的第二氧化物薄膜;对第一和​​第二氧化物薄膜进行热处理。; COPYRIGHT KIPO 2015

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