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Non-spherical shape measuring method, shape measurement program and shape measurement device

机译:非球形形状测量方法,形状测量程序和形状测量装置

摘要

PROBLEM TO BE SOLVED: To provide an aspherical shape measuring method, a shape measuring program, and a shape measuring device which can measure a test aspherical surface with high accuracy and at high speed.;SOLUTION: An interference fringe image is obtained by detecting interference light. A shape of a vertical incidence region 32 in which a measuring beam vertically enters a test aspherical surface in null regions 30, 31 on the interference fringe image is calculated with high accuracy. A shape of a non-vertical incidence region 33 which is a region other than the vertical incidence region in the null regions 30, 31 is calculated as a relative shape of the vertical incidence region.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种非球面形状的测量方法,形状测量程序和形状测量装置,可以高精度,高速地测量待测非球面表面;解决方案:通过检测干涉获得干涉条纹图像光。高精度地算出了测量光束在干涉条纹图像上的零区域30、31中垂直入射到测试非球面的垂直入射区域32的形状。作为垂直入射区域的相对形状,计算出非垂直入射区域33的形状,该非垂直入射区域33是无效区域30、31中除了垂直入射区域以外的区域。COPYRIGHT:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5955001B2

    专利类型

  • 公开/公告日2016-07-20

    原文格式PDF

  • 申请/专利权人 キヤノン株式会社;

    申请/专利号JP20120013168

  • 发明设计人 末永 健太郎;

    申请日2012-01-25

  • 分类号G01B11/24;G01B9/02;

  • 国家 JP

  • 入库时间 2022-08-21 14:43:42

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