MARK PROJECTION DEVICE, MARK PROJECTION METHOD, SHAPE MEASUREMENT DEVICE, SHAPE MEASUREMENT SYSTEM, SHAPE MEASUREMENT METHOD, STRUCTURE MANUFACTURING SYSTEM, STRUCTURING MANUFACTURING METHOD AND SHAPE MEASUREMENT PROGRAM

摘要

PROBLEM TO BE SOLVED: To measure a three-dimensional shape of an object of measurement in short time.;SOLUTION: A mark projection device photographing an object, and plurally projecting a mark detectable by a three-dimensional shape measuring instrument measuring a three-dimensional shape of the object to the object on the basis of a result of the photographing comprises: a measurement unit that measures a distance to the object; a projection unit that projects plurality of marks to the object; and a control unit that controls so that the plurality of marks falls within a prescribed range on the object on the basis of the distance.;COPYRIGHT: (C)2016,JPO&INPIT