首页> 外国专利> SHAPE MEASUREMENT METHOD, STRUCTURE MANUFACTURING METHOD, SHAPE MEASUREMENT PROGRAM, OPTICAL TYPE SHAPE MEASUREMENT DEVICE, STRUCTURE MANUFACTURING SYSTEM AND MEASUREMENT CONDITION SETTING DEVICE

SHAPE MEASUREMENT METHOD, STRUCTURE MANUFACTURING METHOD, SHAPE MEASUREMENT PROGRAM, OPTICAL TYPE SHAPE MEASUREMENT DEVICE, STRUCTURE MANUFACTURING SYSTEM AND MEASUREMENT CONDITION SETTING DEVICE

机译:形状测量方法,结构制造方法,形状测量程序,光学型形状测量设备,结构制造系统和测量条件设定设备

摘要

PROBLEM TO BE SOLVED: To provide a shape measurement method that enables an accurate measurement of a shape of a measurement object.;SOLUTION: The shape measurement method has: an irradiation step of irradiating a first area of a measurement object with measurement light from an optical probe; a photographing step of photographing an image of the first area irradiated with the measurement light by the optical probe, and generating image data on the image of the photographed first area; a deviation calculation step of calculating deviation information indicative of a deviation between a position of the first area of the measurement object and a position of a reference area on the basis of the image data generated in the photographing step and reference image data; and a measurement step of measuring a position of each portion of the measurement object by the optical probe, while changing a relative position between the optical probe and the measurement object.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种形状测量方法,该形状测量方法能够精确地测量被测量物体的形状。解决方案:该形状测量方法具有:辐照步骤,该辐照步骤用来自物体的测量光照射测量对象的第一区域。光学探头拍摄步骤,拍摄由光学探头照射了测量光的第一区域的图像,并在拍摄的第一区域的图像上生成图像数据;偏差计算步骤,基于在摄影步骤中生成的图像数据和基准图像数据,计算表示被测物的第一区域的位置与基准区域的位置之间的偏差的偏差信息。 ;以及一种通过改变光学探针与被测物之间的相对位置而通过光学探针来测量被测物的每个部分的位置的测量步骤。版权所有:(C)2014,日本特许厅&INPIT

著录项

  • 公开/公告号JP2014137265A

    专利类型

  • 公开/公告日2014-07-28

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20130005460

  • 发明设计人 YAMAGUCHI MASAYA;

    申请日2013-01-16

  • 分类号G01B11/24;G01B11/00;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:20

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