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III-V group pit defects has been reduced semiconductor structure and method of forming the same

机译:降低了III-V族凹坑缺陷的半导体结构及其形成方法

摘要

Execution configuration regards the semiconductor structure and its formation manner. In several execution configurations, these manners can be used in order to produce the semiconductor structure which consists of the IIIV group material of InGaN and the like. InIIIV group semiconductor formation, in order InIIIV group semiconductor formation to bring the oversaturation status which grows at V pit density which is lightened than saturation status, grows at the indium concentration which exceeds saturation status by adjusting growth condition such as temperature of the growth surface.
机译:执行配置取决于半导体结构及其形成方式。在几种实施方式中,可以使用这些方式来制造由InGaN等的IIIV族材料构成的半导体结构。 InIIIV族半导体形成中,为了使InIIIV族半导体形成为以比饱和状态轻的V坑密度生长的过饱和状态,通过调整生长面的温度等生长条件,以超过饱和状态的铟浓度生长。

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