METHOD AND APPARATUS FOR TESTING DEVICES BY USING SERIALLY CONTROLLED RESOURCES

摘要

PROBLEM TO BE SOLVED: To enhance performance of wafer probe cards for testing semiconductor devices.SOLUTION: Methods and apparatus for testing devices by using serially controlled resources have been described. Examples of the invention can relate to an apparatus for testing a device under test (DUT). In some examples, an apparatus can include an integrated circuit (IC) having serialized input coupled to test circuits, the test circuits selectively communicating test signals to the DUT responsively to a test control signal on the serialized input.