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Isolation Trench Fill Using Oxide Liner and Nitride Etch Back Technique With Dual Trench Depth Capability

机译:使用具有双沟槽深度功能的氧化物衬里和氮化物刻蚀技术隔离沟槽

摘要

An oxide layer is formed over a substrate having a smaller isolation trench and a large isolation trench. A nitride layer is formed over the oxide layer such that it completely fills the smaller isolation trench and lines the larger isolation trench. The nitride layer is etched back to form a recess in the nitride layer in the smaller isolation trench while at least a portion of the nitride layer lining the larger isolation trench is completely removed. A layer of HDP oxide is deposited over the substrate, completely filling the smaller and larger isolation trenches. The HDP oxide layer is planarized to the upper surface of the substrate. The deeper larger isolation trench may be formed by performing an etching step after the nitride layer has been etched back, prior to depositing HDP oxide.
机译:在具有较小隔离沟槽和较大隔离沟槽的衬底上方形成氧化物层。在氧化物层上方形成氮化物层,使得其完全填充较小的隔离沟槽并排列较大的隔离沟槽。蚀刻回氮化物层以在较小的隔离沟槽中的氮化物层中形成凹口,而与较大的隔离沟槽相衬的氮化物层的至少一部分被完全去除。 HDP氧化物层沉积在基板上,完全填充了越来越大的隔离沟槽。 HDP氧化物层被平坦化至衬底的上表面。较深的较大的隔离沟槽可以通过在氮化物层已经被回蚀之后,在沉积HDP氧化物之前执行蚀刻步骤来形成。

著录项

  • 公开/公告号US2016247878A1

    专利类型

  • 公开/公告日2016-08-25

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US201615147242

  • 发明设计人 XIANFENG ZHOU;

    申请日2016-05-05

  • 分类号H01L29/06;H01L21/3105;H01L27/115;H01L21/762;

  • 国家 US

  • 入库时间 2022-08-21 14:35:47

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