首页> 外国专利> SEMICONDUCTOR MANUFACTURING APPARATUS, DIAGNOSTIC SYSTEM FOR SEMICONDUCTOR MANUFACTURING APPARATUS, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR MANUFACTURING APPARATUS, DIAGNOSTIC SYSTEM FOR SEMICONDUCTOR MANUFACTURING APPARATUS, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

机译:半导体制造装置,用于半导体制造装置的诊断系统以及用于制造半导体装置的方法

摘要

A semiconductor manufacturing apparatus capable of stable operation includes a processing chamber where a wafer is treated, a vacuum pump that is coupled with the processing chamber and evacuates the processing chamber, a monitor that measures the drive state of the vacuum pump, and an exhaust assisting device that is arranged on the exhaust side of the vacuum pump, in which the monitor measures the drive state of the vacuum pump in a state the vacuum pump and the exhaust assisting device are driven.
机译:能够稳定运行的半导体制造设备包括:处理室,在该处理室中处理晶片;真空泵,该真空泵与该处理室联接并排空该处理室;监视器,其测量真空泵的驱动状态;以及排气辅助装置该装置布置在真空泵的排气侧,其中在真空泵和排气辅助装置被驱动的状态下,监视器测量真空泵的驱动状态。

著录项

  • 公开/公告号US2016218026A1

    专利类型

  • 公开/公告日2016-07-28

    原文格式PDF

  • 申请/专利权人 RENESAS ELECTRONICS CORPORATION;

    申请/专利号US201514973392

  • 发明设计人 KAICHIRO KOBAYASHI;

    申请日2015-12-17

  • 分类号H01L21/67;H01L21/66;

  • 国家 US

  • 入库时间 2022-08-21 14:35:27

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