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Gallium arsenide based device having a narrow band-gap semiconductor contact layer

机译:具有窄带隙半导体接触层的砷化镓基器件

摘要

A device includes a semiconductor die. The semiconductor die includes a plurality of semiconductor layers disposed on a GaAs substrate, including a first semiconductor layer having a first band-gap and a second semiconductor layer having a second band-gap. The semiconductor die further includes a contact layer disposed epitaxially upon the first semiconductor layer. The contact layer has a thickness that is less than a critical thickness. The second semiconductor layer is epitaxially disposed upon the contact layer. The contact layer has a third band-gap that is less than the first band-gap and the second band-gap. The semiconductor die further includes a conductive layer disposed upon the contact layer to form an ohmic contact. The conductive layer comprises one or more metal layers compatible with silicon processing techniques.
机译:器件包括半导体管芯。半导体管芯包括设置在GaAs衬底上的多个半导体层,该多个半导体层包括具有第一带隙的第一半导体层和具有第二带隙的第二半导体层。半导体管芯还包括外延设置在第一半导体层上的接触层。接触层的厚度小于临界厚度。第二半导体层外延设置在接触层上。接触层具有小于第一带隙和第二带隙的第三带隙。半导体管芯还包括设置在接触层上以形成欧姆接触的导电层。导电层包括与硅处理技术兼容的一个或多个金属层。

著录项

  • 公开/公告号US9269784B2

    专利类型

  • 公开/公告日2016-02-23

    原文格式PDF

  • 申请/专利权人 GLOBAL COMMUNICATION SEMICONDUCTORS INC.;

    申请/专利号US201414463612

  • 发明设计人 LIPING D. HOU;YUEFEI YANG;SHING-KUO WANG;

    申请日2014-08-19

  • 分类号H01L29/66;H01L29/45;H01L29/778;H01L29/737;H01L29/205;H01L23/64;H01L27/06;H01L23/29;H01L21/56;

  • 国家 US

  • 入库时间 2022-08-21 14:29:34

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