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Laser and plasma etch wafer dicing with partial pre-curing of UV release dicing tape for film frame wafer application

机译:激光和等离子蚀刻晶圆划片,通过紫外线释放划片带的部分预固化,用于胶片框架晶圆应用

摘要

Methods and systems of laser and plasma etch wafer dicing using UV-curable adhesive films. A method includes forming a mask covering ICs formed on the wafer. The semiconductor wafer is coupled to a film frame by a UV-curable adhesive film. A pre-cure of the UV-curable adhesive film cures a peripheral portion of the adhesive extending beyond an edge of the wafer to improve the exposed adhesive material's resistance to plasma etch and reduce hydrocarbon redeposition within the etch chamber. The mask is patterned by laser scribing to provide a patterned mask with gaps. The patterning exposes regions of the semiconductor wafer, below thin film layers from which the ICs are formed. The semiconductor wafer is plasma etched through the gaps in the patterned mask to singulate the ICs. A center portion of the UV-curable adhesive is then cured and the singulated ICs detached from the film.
机译:使用可紫外线固化的粘合膜对激光和等离子蚀刻晶圆划片的方法和系统。一种方法包括形成覆盖形成在晶片上的IC的掩模。半导体晶片通过可UV固化的粘合剂膜耦合到膜框架。 UV可固化粘合剂膜的预固化使粘合剂的外围部分固化,该外围部分延伸超过晶片的边缘,以提高暴露的粘合剂材料对等离子体蚀刻的抵抗力并减少碳氢化合物在蚀刻室内的沉积。通过激光刻划将掩模图案化以提供具有间隙的图案化掩模。图案化暴露半导体晶片的在薄膜层下方的形成IC的区域。通过图案化的掩模中的间隙对半导体晶片进行等离子体蚀刻,以将IC单个化。然后,将可UV固化粘合剂的中心部分固化,并且将单个IC从膜上剥离。

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