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SAMPLE HOLD CIRCUIT, A/D CONVERTER, CALIBRATION METHOD OF THE SAMPLE HOLD CIRCUIT, AND CIRCUIT
SAMPLE HOLD CIRCUIT, A/D CONVERTER, CALIBRATION METHOD OF THE SAMPLE HOLD CIRCUIT, AND CIRCUIT
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机译:样品保持电路,A / D转换器,样品保持电路的校准方法以及电路
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摘要
There is provided a pipelined A/D converter in which plural stages Stage 1 to Stage N each including an MDAC (i.e., Multiplying DA Converter) are connected. The pipelined A/D converter is configured with a Gain-AMP (12) included in the MDAC for the SPM, MOS transistors (Mx1) and (Mx2) as a differential pair having output ends connected to a sampling capacitor CsI on a subsequent stage, MOS transistors (My1) and (My2) as a load unit connected to the differential pair, a current source (13) configured to supply a current to the MOS transistors (Mx1) and (Mx2) as the differential pair, and current sources (I1) and (12) configured to adjust the current flown across the MOS transistors (My1) and (My2) as the load unit.
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