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SAMPLE HOLD CIRCUIT, A/D CONVERTER, CALIBRATION METHOD OF THE SAMPLE HOLD CIRCUIT, AND CIRCUIT

机译:样品保持电路,A / D转换器,样品保持电路的校准方法以及电路

摘要

There is provided a pipelined A/D converter in which plural stages Stage 1 to Stage N each including an MDAC (i.e., Multiplying DA Converter) are connected. The pipelined A/D converter is configured with a Gain-AMP (12) included in the MDAC for the SPM, MOS transistors (Mx1) and (Mx2) as a differential pair having output ends connected to a sampling capacitor CsI on a subsequent stage, MOS transistors (My1) and (My2) as a load unit connected to the differential pair, a current source (13) configured to supply a current to the MOS transistors (Mx1) and (Mx2) as the differential pair, and current sources (I1) and (12) configured to adjust the current flown across the MOS transistors (My1) and (My2) as the load unit.
机译:提供了一种流水线式A / D转换器,其中连接了分别包括MDAC的多个阶段Stage 1至阶段N(即,乘法DA转换器)。流水线式A / D转换器配置有MDAC中包含的用于SPM的增益AMP(12),作为差分对的MOS晶体管(Mx1)和(Mx2),其输出端与后一级的采样电容器CsI连接,作为连接到差分对的负载单元的MOS晶体管(My1)和(My2),配置为向作为差分对的MOS晶体管(Mx1)和(Mx2)提供电流的电流源(13)和电流源(I1)和(12)被配置为调节流过作为负载单元的MOS晶体管(My1)和(My2)的电流。

著录项

  • 公开/公告号EP2894788B1

    专利类型

  • 公开/公告日2017-04-12

    原文格式PDF

  • 申请/专利权人 ASAHI KASEI MICRODEVICES CORP;

    申请/专利号EP20130834525

  • 发明设计人 MIYAHARA YUICHI;

    申请日2013-08-12

  • 分类号H03M1/06;H03M1/16;H03M1/44;

  • 国家 EP

  • 入库时间 2022-08-21 14:06:39

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