TEST PIECE ANALYSIS DEVICE AND TEST PIECE ANALYSIS METHOD

摘要

PROBLEM TO BE SOLVED: To provide a test piece analysis device and a test piece analysis method capable of performing analysis even though a test piece is small and mounted inclinedly.SOLUTION: The test piece analysis device includes: an imaging unit 20 including a light source 21 for illuminating a test piece provided with a reagent pad, and an imaging element 22 in which the size of an imaging area is set so as to image a portion of the test piece; and an image processing part 82 for compositing a plurality of partial images acquired by imaging the test piece by the imaging element 22 while changing positions of the imaging unit 20, and performing composition processing for acquiring a composite image including the entire test piece.SELECTED DRAWING: Figure 6