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III-N transistor with an epitaxial layer providing a steep subthreshold swing

机译:具有外延层的III-N晶体管可提供陡峭的亚阈值摆幅

摘要

A III-N transistor having a steep subthreshold gradient and having an epitaxial semiconductor heterostructure is described. In embodiments, the III-N HFET employs a gate stack that is balanced and has opposing III-N polarization materials. For the opposing III-N polarization material, the overall effective polarization may be modulated by an external field, eg, related to the applied gate electrode voltage. In embodiments, the polarization strength difference between the III-N materials in the gate stack is adjusted by composition and / or film thickness to achieve the desired transistor threshold voltage (Vt). The polarization strength in the opposite gate stack is balanced with respect to each other, both forward and inverted gate voltage sweeps, where charge carriers are transferred to or from the III-N polarization layer and III-N channel semiconductor. When done, it can produce a sharp subthreshold swing in the drain current.
机译:描述了具有陡峭的亚阈值梯度并且具有外延半导体异质结构的III-N晶体管。在实施例中,III-N HFET采用平衡的栅极堆叠并具有相反的III-N极化材料。对于相对的III-N极化材料,可以通过例如与所施加的栅电极电压有关的外部场来调制总有效极化。在实施例中,通过组成和/或膜厚度来调节栅极堆叠中的III-N材料之间的极化强度差,以实现期望的晶体管阈值电压(Vt)。在正向和反向栅极电压扫描中,相对的栅极叠层中的极化强度彼此平衡,其中电荷载流子转移到III-N极化层和III-N沟道半导体或从中转移。完成后,它会在漏极电流中产生急剧的亚阈值摆幅。

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