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Etching liquid for aluminum oxide film and manufacturing method of thin film semiconductor device using the etching liquid
Etching liquid for aluminum oxide film and manufacturing method of thin film semiconductor device using the etching liquid
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机译:氧化铝膜用蚀刻液及使用该蚀刻液的薄膜半导体装置的制造方法
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摘要
An etching solution includes: phosphoric acid having concentration of 30% by weight to 80% by weight; nitric acid having concentration of 10% by weight or less; and surfactant having concentration of 0.0005% by weight to 0.0050% by weight, wherein the etching solution is used for etching an aluminum oxide film having film density of 2.80 g/cm3 to 3.25 g/cm3.
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机译:蚀刻溶液包括:浓度为30重量%至80重量%的磷酸;和浓度为10%(重量)或以下的硝酸;以及浓度为0.0005重量%至0.0050重量%的表面活性剂,其中所述蚀刻溶液用于蚀刻膜密度为2.80g / cm 3至3.25g / cm 3的氧化铝膜。
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