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ETCHING LIQUID FOR ALUMINUM-OXIDE FILMS AND THIN-FILM-SEMICONDUCTOR-DEVICE MANUFACTURING METHOD USING SAID ETCHING LIQUID
ETCHING LIQUID FOR ALUMINUM-OXIDE FILMS AND THIN-FILM-SEMICONDUCTOR-DEVICE MANUFACTURING METHOD USING SAID ETCHING LIQUID
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机译:铝氧化物膜的蚀刻液及薄膜化半导体膜的制造方法
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摘要
This etching liquid is specialized for etching aluminum-oxide films with densities between 2.80 g/cm3 and 3.25 g/cm3, inclusive. Said etching liquid is prepared so as to contain phosphoric acid in an amount between 30 wt.% and 80 wt.%, inclusive; at most 10 wt.% nitric acid; and a surfactant in an amount between 0.0005 wt.% and 0.0050 wt.%, inclusive.
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机译:该蚀刻液专门用于蚀刻密度在2.80 g / cm 3 Sup>和3.25 g / cm 3 Sup>之间的氧化铝膜。制备所述蚀刻液以使其包含的磷酸含量在30重量%至80重量%之间,包括20重量%和80重量%之间。最多10 wt。%硝酸;表面活性剂的含量为0.0005重量%至0.0050重量%之间。
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