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Insulated gate type power semiconductor device gate drive circuit

机译:绝缘栅型功率半导体器件的栅极驱动电路

摘要

The deterioration of the steady loss of the insulated gate power semiconductor element is prevented. The gate drive circuit (2) includes an NchMOSFET (4) for turning on the insulated gate power semiconductor element (1), a PchMOSFET (5) for turning off the insulated gate power semiconductor element (1), and a positive voltage (8b) is applied to the gate electrode of the NchMOSFET (4) to turn on the NchMOSFET (4), and a negative voltage (9) is applied to the gate electrode of the PchMOSFET (5) to apply the PchMOSFET (5). A negative voltage (9) is applied to the drain electrode of the PchMOSFET (5) and the negative electrode of the control circuit (6), and a positive voltage (8a) is applied to the NchMOSFET ( 4) than the absolute value of the positive voltage (8a) applied to the drain electrode of the Nch MOSFET (4). With power member to be applied to the positive side electrode of the control circuit positive voltage (8b) of the hearing absolute value (6) and (7).
机译:防止了绝缘栅功率半导体元件的稳态损耗的恶化。栅极驱动电路(2)包括用于使绝缘栅型功率半导体元件(1)导通的NchMOSFET(4),用于使绝缘栅型功率半导体元件(1)截止的PchMOSFET(5)以及正电压(8b) )被施加到NchMOSFET(4)的栅极以导通NchMOSFET(4),并且负电压(9)被施加到PchMOSFET(5)的栅极以施加PchMOSFET(5)。将负电压(9)施加到PchMOSFET(5)的漏极和控制电路(6)的负电极,将正电压(8a)施加到NchMOSFET(4)的绝对值大于施加到Nch MOSFET(4)漏极的正电压(8a)。通过将功率构件施加到控制电路的正侧电极,可听到的绝对值(6)和(7)为正电压(8b)。

著录项

  • 公开/公告号JPWO2016002041A1

    专利类型

  • 公开/公告日2017-04-27

    原文格式PDF

  • 申请/专利权人 三菱電機株式会社;

    申请/专利号JP20160530758

  • 发明设计人 大津 一宏;石川 純一郎;

    申请日2014-07-03

  • 分类号H03K17/06;H03K17/56;H02M1/08;

  • 国家 JP

  • 入库时间 2022-08-21 13:54:07

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