An investigation of the drive circuit requirements for the power insulated gate bipolar transistor (IGBT)

摘要

The drive circuit requirements of the insulated gate bipolar transistor (IGBT) are explained with the aid of an analytical model. It is shown that nonquasi-static effects limit the influence of the drive circuit on the time rate-of-change of anode voltage. Model results are compared with measured turn-on and turn-off waveforms for different drive, load, and feedback circuits, and for different IGBT base lifetimes.