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Device for Anisotropically Etching a Substrate, and Method for Operating a Device for Anisotropically Etching a Substrate

机译:各向异性蚀刻衬底的装置以及用于各向异性蚀刻衬底的装置的操作方法

摘要

A device for etching a substrate includes a first reaction chamber into which a first gas is introduced; a second reaction chamber into which a second gas is introduced; and a coil device that generates an electromagnetic alternating field. At least one first reactive species is generated by applying the electromagnetic alternating field to the first gas and at least one second reactive species is generated by applying the electromagnetic alternating field to the second gas. The device further includes a separating device that prevents a direct gas exchange between the first and second reaction chambers; an etching chamber configured to receive the substrate to be anisotropically etched; and a mixing device configured such that the reactive species enter the mixing device, are mixed together, and in the mixed state act on the substrate so as to anisotropically etch the substrate in the etching chamber.
机译:一种用于蚀刻衬底的设备,包括:第一反应室,在第一反应室中引入了第一气体;向其中引入第二气体的第二反应室;线圈装置产生电磁交变场。通过向第一气体施加电磁交变场来产生至少一个第一反应物种,并且通过向第二气体施加电磁交变场来产生至少一个第二反应物种。该装置还包括分离装置,该分离装置防止第一和第二反应室之间的直接气体交换。蚀刻室,其配置为接收待各向异性蚀刻的基板;混合装置,其构成为使反应性种进入混合装置而混合,并以混合状态作用于基板,从而在蚀刻室内对基板进行各向异性蚀刻。

著录项

  • 公开/公告号US2017221732A1

    专利类型

  • 公开/公告日2017-08-03

    原文格式PDF

  • 申请/专利权人 ROBERT BOSCH GMBH;

    申请/专利号US201515502453

  • 发明设计人 FRANZ LAERMER;

    申请日2015-07-06

  • 分类号H01L21/67;H01J37/32;H01L21/3065;

  • 国家 US

  • 入库时间 2022-08-21 13:49:26

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