首页> 外国专利> DEVICE FOR ANISOTROPICALLY ETCHING A SUBSTRATE, AND METHOD FOR OPERATING A DEVICE FOR ANISOTROPICALLY ETCHING A SUBSTRATE

DEVICE FOR ANISOTROPICALLY ETCHING A SUBSTRATE, AND METHOD FOR OPERATING A DEVICE FOR ANISOTROPICALLY ETCHING A SUBSTRATE

机译:用于各向异性地蚀刻基板的装置,以及用于操作用于各向异性蚀刻基板的装置的方法

摘要

A device for etching a substrate includes a first reaction chamber into which a first gas is introduced; a second reaction chamber into which a second gas is introduced; and a coil device that generates an electromagnetic alternating field. At least one first reactive species is generated by applying the electromagnetic alternating field to the first gas and at least one second reactive species is generated by applying the electromagnetic alternating field to the second gas. The device further includes a separating device that prevents a direct gas exchange between the first and second reaction chambers; an etching chamber configured to receive the substrate to be anisotropically etched; and a mixing device configured such that the reactive species enter the mixing device, are mixed together, and in the mixed state act on the substrate so as to anisotropically etch the substrate in the etching chamber.
机译:用于蚀刻基板的装置包括第一反应室,第一反应室引入到该第一气体中; 引入第二气体的第二反应室; 和一个产生电磁交变场的线圈装置。 通过将电磁交替场施加到第一气体来产生至少一种第一反应性物质,并且通过将电磁交通场施加到第二气体来产生至少一个第二反应物质。 该装置还包括分离装置,其防止第一和第二反应室之间的直接气体交换; 蚀刻腔室,其构造成接收待各向异性蚀刻的基板; 和混合装置构造成使得反应性物质进入混合装置,混合在一起,并且在混合状态作用在基板上,以便在蚀刻室中各向异性地蚀刻基板。

著录项

  • 公开/公告号EP3180800B1

    专利类型

  • 公开/公告日2021-12-22

    原文格式PDF

  • 申请/专利权人

    申请/专利号EP20150738293

  • 发明设计人 LAERMER FRANZ;

    申请日2015-07-06

  • 分类号H01L21/67;H01L21/3065;H01J37/32;

  • 国家 EP

  • 入库时间 2022-08-24 22:58:43

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