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Memory devices and methods of operating the memory devices by programming normal cells after programming a first dummy cell

机译:存储器设备和在对第一伪单元进行编程之后通过对普通单元进行编程来操作存储器设备的方法

摘要

A method of operating a memory device including a first memory block having a plurality cell strings is provided. Each of the plurality of cell strings includes a string selection transistor connected in series to a first dummy cell, a plurality of normal cells, a second dummy cell and a ground selection transistor. The method includes programming the first dummy cell, and programming the normal cells in at least one of the cell strings after the programming the first dummy cell. The normal cells are selected based on a first program command inputted to the memory device. The programming the first dummy cell is performed at least twice before the normal cells are programmed. A number of times of programming the first dummy cell is different according to a level of a voltage applied to the first dummy cell and a level of a voltage applied to the normal cells.
机译:提供一种操作包括具有多个单元串的第一存储块的存储装置的方法。多个单元串中的每一个包括串选择晶体管,该串选择晶体管串联连接到第一虚拟单元,多个普通单元,第二虚拟单元和接地选择晶体管。该方法包括:对第一虚拟单元进行编程;以及在对第一虚拟单元进行编程之后,对至少一个单元串中的正常单元进行编程。基于输入到存储设备的第一程序命令来选择正常单元。在对普通单元进行编程之前,对第一虚拟单元进行编程至少两次。根据施加到第一虚拟单元的电压的电平和施加到正常单元的电压的电平,对第一虚拟单元进行编程的次数是不同的。

著录项

  • 公开/公告号US9721664B2

    专利类型

  • 公开/公告日2017-08-01

    原文格式PDF

  • 申请/专利权人 SANG-WAN NAM;KYUNG-MIN KANG;

    申请/专利号US201514605433

  • 发明设计人 KYUNG-MIN KANG;SANG-WAN NAM;

    申请日2015-01-26

  • 分类号G11C11/34;G11C16/10;G11C16/04;G11C7/14;

  • 国家 US

  • 入库时间 2022-08-21 13:43:33

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