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Package on package (POP) device comprising solder connections between integrated circuit device packages

机译:封装(POP)器件,包括集成电路器件封装之间的焊接连接

摘要

Some features pertain to a package on package (PoP) device that includes a first package, a first solder interconnect coupled to the first integrated circuit package, and a second package coupled to the first package through the first solder interconnect. The second package includes a first die, a package interconnect comprising a first pad, where the first solder interconnect is coupled to the first pad of the package interconnect. The second package also includes a redistribution portion coupled to the first die and the package interconnect, an encapsulation layer at least partially encapsulating the first die and the package interconnect. The first pad may include a surface that has low roughness. The encapsulation layer may encapsulate the package interconnect such that the encapsulation layer encapsulates at least a portion of the first solder interconnect.
机译:一些特征涉及封装上封装(PoP)装置,该装置包括第一封装,耦合到第一集成电路封装的第一焊料互连,以及通过第一焊料互连耦合到第一封装的第二封装。第二封装包括第一管芯,包括第一焊盘的封装互连,其中第一焊料互连耦合到封装互连的第一焊盘。第二封装还包括耦合到第一管芯和封装互连的再分配部分,至少部分地封装第一管芯和封装互连的封装层。第一垫可以包括具有低粗糙度的表面。包封层可以包封封装互连,使得包封层包封第一焊料互连的至少一部分。

著录项

  • 公开/公告号US9601472B2

    专利类型

  • 公开/公告日2017-03-21

    原文格式PDF

  • 申请/专利权人 QUALCOMM INCORPORATED;

    申请/专利号US201514837917

  • 发明设计人 LIZABETH ANN KESER;DAVID FRASER RAE;

    申请日2015-08-27

  • 分类号H01L25/10;H01L23/498;H01L23;H01L25;H01L21/56;

  • 国家 US

  • 入库时间 2022-08-21 13:43:30

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