首页> 外国专利> Nonvolatile memory device having variable resistance memory cells and a method of resetting by initially performing pre-read or strong set operation

Nonvolatile memory device having variable resistance memory cells and a method of resetting by initially performing pre-read or strong set operation

机译:具有可变电阻存储单元的非易失性存储装置及其通过初始执行预读或强置位操作进行复位的方法

摘要

A method of resetting a variable resistance memory cell in a nonvolatile memory device includes; programming the memory cell to a set state using a corresponding compliance current, and then programming the memory cell to a reset state by pre-reading the variable resistance memory cell to determine its resistance and resetting the memory cell using a variable reset voltage determined in response to the determined resistance.
机译:一种在非易失性存储器件中重置可变电阻存储单元的方法,包括:使用相应的顺应性电流将存储单元编程为置位状态,然后通过预读可变电阻存储单元以确定其电阻并使用响应于此的可变复位电压来重置存储单元,将存储单元编程为复位状态到确定的阻力。

著录项

  • 公开/公告号US9552879B2

    专利类型

  • 公开/公告日2017-01-24

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US201414505523

  • 发明设计人 YEONGTAEK LEE;YOUNGBAE KIM;YONGKYU LEE;

    申请日2014-10-03

  • 分类号G11C11/00;G11C13/00;G11C11/56;

  • 国家 US

  • 入库时间 2022-08-21 13:42:39

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号