首页> 外国专利> Amorphous layer extreme ultraviolet lithography blank, and manufacturing and lithography systems therefor

Amorphous layer extreme ultraviolet lithography blank, and manufacturing and lithography systems therefor

机译:非晶层极紫外光刻坯料及其制造和光刻系统

摘要

An integrated extreme ultraviolet blank production system includes: a vacuum chamber for placing a substrate in a vacuum; a deposition system for depositing a multi-layer stack without removing the substrate from the vacuum; and a treatment system for treating a layer on the multi-layer stack to be deposited as an amorphous metallic layer. A physical vapor deposition chamber for manufacturing an extreme ultraviolet mask blank includes: a target, comprising molybdenum alloyed with boron. An extreme ultraviolet lithography system includes: an extreme ultraviolet light source; a mirror for directing light from the extreme ultraviolet light source; a reticle stage for placing an extreme ultraviolet mask blank with a multi-layer stack having an amorphous metallic layer; and a wafer stage for placing a wafer. An extreme ultraviolet blank includes: a substrate; a multi-layer stack having an amorphous metallic layer; and capping layers over the multi-layer stack.
机译:一种集成的极紫外毛坯生产系统,包括:真空室,用于将衬底置于真空中;用于在不从真空中去除基板的情况下沉积多层堆叠的沉积系统;处理系统,用于将多层堆叠上的层作为非晶金属层进行处理。一种用于制造极紫外掩模坯料的物理气相沉积室,其包括:靶,其包含与硼合金化的钼。一种极紫外光刻系统,包括:极紫外光源;用于引导来自极紫外光源的光的镜子;掩模版台,用于放置具有多层堆叠的极紫外掩模坯料,该多层堆叠具有非晶态金属层;以及用于放置晶片的晶片台。一种极紫外光坯料,包括:基材;具有非晶态金属层的多层堆叠;并覆盖多层堆栈上的层。

著录项

  • 公开/公告号US9612521B2

    专利类型

  • 公开/公告日2017-04-04

    原文格式PDF

  • 申请/专利权人 APPLIED MATERIALS INC.;

    申请/专利号US201314139371

  • 发明设计人 RALF HOFMANN;KEVIN MORAES;

    申请日2013-12-23

  • 分类号G03F1/24;G03F1/22;C23C14/35;G03F7/20;C23C14/16;

  • 国家 US

  • 入库时间 2022-08-21 13:41:45

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