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Balance mass system shared by workpiece table and mask table, and lithography machine

机译:工件台和掩模台共用的平衡质量系统以及光刻机

摘要

A balance mass system shared by a workpiece stage and a mask stage includes a balance mass and an anti-drift and compensation apparatus (16). The balance mass includes a first part (11) for mounting thereon a workpiece stage system, a second part (20) for mounting thereon a mask stage system, and a third part (14) for interconnecting the first part (11) and the second part (20). The first part (11) of the balance mass is floatingly supported on a base frame (1) of a lithography machine, and the third part (14) of the balance mass is in connection with the base frame (1) via the anti-drift and compensation apparatus (16). The anti-drift and compensation apparatus (16) is disposed in proximity to the center of gravity of the balance mass as a whole. This balance mass system can eliminate the need for using an additional support for the mask stage system and allow the construction of a lithography machine with a higher structural compactness, reduced size and weight, and reduced total mass of used balance masses.
机译:工件台和掩模台共用的平衡质量系统包括平衡质量和防漂移补偿装置( 16 )。平衡块包括用于在其上安装工件台系统的第一部分( 11 ),用于在其上安装掩模台系统的第二部分( 20 )和第三部分( 14 )用于互连第一部分( 11 )和第二部分( 20 )。平衡质量的第一部分( 11 )浮动支撑在光刻机的基础框架( 1 )上,第三部分( 14 )通过防漂移和补偿装置( 16 )与基础框架( 1 )连接。防漂移补偿装置( 16 )整体上靠近平衡块的重心。该平衡质量系统可以消除对掩模台系统使用额外支撑的需要,并允许构造具有更高的结构紧凑性,减小的尺寸和重量以及减少的所用平衡质量的总质量的光刻机。

著录项

  • 公开/公告号US9588444B2

    专利类型

  • 公开/公告日2017-03-07

    原文格式PDF

  • 申请/专利权人 SHANGHAI MICRO ELECTRONICS EQUIPMENT CO. LTD.;

    申请/专利号US201314437775

  • 发明设计人 TIANMING WANG;

    申请日2013-09-23

  • 分类号G03F7/20;F16F7/10;F16F15/00;

  • 国家 US

  • 入库时间 2022-08-21 13:41:39

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