首页> 外国专利> MIDDLE OF LINE (MOL) MANUFACTURED INTEGRATED CIRCUITS (ICS) EMPLOYING LOCAL INTERCONNECTS OF METAL LINES USING AN ELONGATED VIA AND RELATED METHODS

MIDDLE OF LINE (MOL) MANUFACTURED INTEGRATED CIRCUITS (ICS) EMPLOYING LOCAL INTERCONNECTS OF METAL LINES USING AN ELONGATED VIA AND RELATED METHODS

机译:线(MOL)制造的集成电路(ICS),使用长距离的方法通过金属线进行局部互连,以及相关方法

摘要

Middle of line (MOL) manufactured integrated circuits (ICs) employing local interconnects of metal lines using an elongated via are disclosed. Related methods are also disclosed. In particular different metal lines in a metal layer may need to be electrically interconnected during a MOL process for an IC. In this regard to allow for metal lines to be interconnected without providing such interconnections above the metal lines that may be difficult to provide in a printing process for example in an exemplary aspect an elongated or expanded via(s) is provided in a MOL layer in an IC. The elongated via is provided in the MOL layer below the metal layer in the MOL layer and extended across two or more adjacent metal layers in the metal layer of the MOL layer. Moving the interconnections above the MOL layer can simplify the manufacturing of ICs particularly at low nanometer (nm) node sizes.
机译:公开了采用中线(MOL)制造的集成电路(IC),所述集成电路采用金属线的局部互连,所述互连使用细长的通孔。还公开了相关方法。特别地,在用于IC的MOL工艺期间,金属层中的不同金属线可能需要电互连。就这一点而言,允许在不提供金属线上方的这种互连的情况下互连金属线,这在印刷过程中可能难以提供,例如,在示例性方面中,在MOL层中提供细长或扩展的通孔。 IC。细长通孔设置在MOL层中金属层下方的MOL层中,并横跨MOL层金属层中的两个或多个相邻金属层延伸。将互连移动到MOL层上方可以简化IC的制造,尤其是在低纳米(nm)节点尺寸的情况下。

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