DEVICE FOR MEASURING THE DEFECTS OF AN IMAGING INSTRUMENT WITH TWO OPTO- ELECTRONIC SENSORS

摘要

pThe present invention relates to a device for measuring defects of an imaging instrument with a sensor that is accurate, simple to produce and implement and inexpensive. According to the invention, this device comprising at least one second sensor, similar to the first, inclined relative thereto and imaging the same region as the first sensor, and a device for calculating the defocusing of each element of this other sensor./p[US2010278378A1]