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Methods of modifying surfaces of structures used in the manufacture of a semiconductor device via fluorination

机译:通过氟化修饰用于制造半导体器件的结构的表面的方法

摘要

Disclosed are methods for modifying surfaces of structures used in manufacturing semiconductor devices, wherein the structures are formed from organic polymers. In addition to the surface above the center of the structure, a portion of the structure slightly below the surface is also modified through fluorination of the organic polymer. The fluorination is achieved by exposing the structure to a mixture of gases including fluorine in a range from about 0.01% to about 10% and inert gas comprising a remainder of the mixture of gases. Fluorination occurs from the surface into the center to a depth of no more than about 1 micron, such that a portion of the center below more than 1 micron from the surface is not fluorinated.
机译:公开了用于修饰在制造半导体器件中使用的结构的表面的方法,其中所述结构由有机聚合物形成。除了结构中心上方的表面之外,结构中稍低于表面的一部分也通过有机聚合物的氟化而改性。通过将结构暴露于包含约0.01%至约10%范围内的氟的气体和包含其余气体混合物的惰性气体的混合物中来实现氟化。从表面到中心的氟化发生到不超过约1微米的深度,以使中心的距离表面1微米以下的部分不被氟化。

著录项

  • 公开/公告号KR20170057121A

    专利类型

  • 公开/公告日2017-05-24

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20160098299

  • 发明设计人 GARZA CESAR M.;AHN SUNG IL;

    申请日2016-08-02

  • 分类号H01L21/3105;H01L21/02;H01L51;

  • 国家 KR

  • 入库时间 2022-08-21 13:27:26

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