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GALLIUM NITRIDE-BASED HIGH ELECTRON MOBILITY TRANSISTOR ELEMENT HAVING FILLING HOLE FORMED ON REAR SURFACE THEREOF, AND MANUFACTURING METHOD THEREOF
GALLIUM NITRIDE-BASED HIGH ELECTRON MOBILITY TRANSISTOR ELEMENT HAVING FILLING HOLE FORMED ON REAR SURFACE THEREOF, AND MANUFACTURING METHOD THEREOF
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机译:具有填充在后表面上的孔的基于氮化镓的高电子迁移率晶体管元件及其制造方法
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摘要
Provided are a gallium nitride-based high electron mobility transistor element having a filling hole formed on a rear surface thereof, and a manufacturing method thereof. The gallium nitride-based high electron mobility transistor element has a structure of forming a through-hole on a front surface, wherein the structure fills the through-hole passing through a lower part of a source electrode with a material having high thermal conductivity and capable of being plated.;COPYRIGHT KIPO 2017
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