首页> 外国专利> GALLIUM NITRIDE-BASED HIGH ELECTRON MOBILITY TRANSISTOR ELEMENT HAVING FILLING HOLE FORMED ON REAR SURFACE THEREOF, AND MANUFACTURING METHOD THEREOF

GALLIUM NITRIDE-BASED HIGH ELECTRON MOBILITY TRANSISTOR ELEMENT HAVING FILLING HOLE FORMED ON REAR SURFACE THEREOF, AND MANUFACTURING METHOD THEREOF

机译:具有填充在后表面上的孔的基于氮化镓的高电子迁移率晶体管元件及其制造方法

摘要

Provided are a gallium nitride-based high electron mobility transistor element having a filling hole formed on a rear surface thereof, and a manufacturing method thereof. The gallium nitride-based high electron mobility transistor element has a structure of forming a through-hole on a front surface, wherein the structure fills the through-hole passing through a lower part of a source electrode with a material having high thermal conductivity and capable of being plated.;COPYRIGHT KIPO 2017
机译:提供一种在其背面形成有填充孔的氮化镓类高电子迁移率晶体管元件及其制造方法。氮化镓基高电子迁移率晶体管元件具有在前表面上形成通孔的结构,其中该结构用具有高导热率并且能够填充的材料填充穿过源电极下部的通孔。镀金; COPYRIGHT KIPO 2017

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