首页> 外国专利> SURFACE TREATMENT METHOD FOR SUBSTRATE, SUBSTRATE, METHOD FOR GROWING GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR, GALLIUM-NITRIDE-BASED COMPOUND SEMICONDUCTOR, LIGHT-EMITTING ELEMENT AND ELECTRONIC ELEMENT

SURFACE TREATMENT METHOD FOR SUBSTRATE, SUBSTRATE, METHOD FOR GROWING GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR, GALLIUM-NITRIDE-BASED COMPOUND SEMICONDUCTOR, LIGHT-EMITTING ELEMENT AND ELECTRONIC ELEMENT

机译:基质的表面处理方法,基质,生长氮化镓基复合半导体的方法,氮化镓基复合半导体,发光元素和电子元素

摘要

PROBLEM TO BE SOLVED: To provide surface treatment method by which, when a substrate made of biboride single crystal, such as ZrB2, is heated to remove a natural oxide film, segregation of elements, such as, Zr due to removal of boron is suppressed to realize stable controlling so that the stoichiometric composition ratio of the surface of the substrate becomes that of the substrate itself.;SOLUTION: The method of surface treatment for a substrate includes a step 1, wherein a substrate made of biboride single crystal that is represented by chemical Formula XB2 (X contains at least one kind from among Ti, Mg, Al, Hf, and Zr) and is placed in a heat treatment apparatus is heated to remove the natural oxide film on the surface of the substrate; and a step 2 wherein boron compound is supplied to the heat treatment apparatus and boron is replenished to a boron-deficient part on the surface of the substrate, while heating the substrate.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种表面处理方法,当加热由硼化单晶制成的基板(例如ZrB 2 )以去除自然氧化膜时,元素的偏析,例如,抑制了由于硼的去除而引起的Zr的实现,从而实现稳定的控制,从而使基板表面的化学计量组成比变为基板本身的化学计量组成比。解决方案:基板的表面处理方法包括步骤1,其中基板由化学式XB 2 (X包含Ti,Mg,Al,Hf和Zr中的至少一种)表示的双硼化物单晶制成,并置于热处理装置中加热去除基板表面的自然氧化膜;步骤2,其中,在加热基板的同时,将硼化合物供给至热处理装置,并向基板表面的硼不足部位补硼。(C)2008,JPO&INPIT

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