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With a high electron mobility transistor with a charge carrier injection attenuation - gate - structure

机译:具有高电子迁移率晶体管的电荷载流子注入衰减-栅极-结构

摘要

A method comprising providing a hetero structure body with a buffer zone and a barrier region, which, on the buffer zone is arranged, and the production of a gate - structure for controlling of the channel on the hetero structure body, wherein the gate - structure of a doped semiconductor region, which, on the hetero structure body is disposed, an intermediate layer which is arranged on the doped semiconductor region, and a gate - electrode, which is arranged on the intermediate layer has. The production of the gate - structure comprises the control of a doping concentration of the doped semiconductor region, so that a section of the channel adjacent to the gate - structure in the case of a gate - preload of zero is not conductive, and control of electrical and geometric properties of the intermediate layer on the basis of a relationship between the electrical and geometric properties of the intermediate layer and corresponding effects on a static threshold voltage and a dynamic threshold voltage displacement of the semiconductor component.
机译:一种方法,其包括为异质结构体提供具有缓冲区和势垒区,该缓冲区和势垒区布置在该缓冲区上,以及制造用于控制异质结构体上的沟道的栅极结构,其中,栅极结构具有在异质结构体上布置的掺杂半导体区域的衬底具有布置在掺杂半导体区域上的中间层和布置在该中间层上的栅电极。栅极结构的产生包括控制掺杂半导体区域的掺杂浓度,使得在栅极预载为零的情况下,与栅极结构相邻的沟道部分不导电,并且控制基于中间层的电气和几何特性之间的关系以及对半导体组件的静态阈值电压和动态阈值电压位移的相应影响,确定中间层的电气和几何特性。

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