Characteristic impedance measuring apparatus, characteristic impedance measuring system, and characteristic impedance measuring method

摘要

PROBLEM TO BE SOLVED: To increase the spatial resolution of characteristic impedance distribution without being subject to limitations due to the maximum value of a usable frequency.SOLUTION: This characteristic impedance measurement device is provided with: a characteristic measurement unit 11 for setting the number of unknown characteristic impedances Zin each minute section m and the same number or more of angular frequencies ω, and measuring the reflection characteristic S11(ω) of a printed wiring board 3 at each of a plurality of set angular frequencies ω; and a simultaneous equation generation unit 22 for applying the reflection characteristic S11(ω) at each of angular frequencies ωto a model held by a model holding unit 21 and thereby generating a number of simultaneous equations equal to or greater than the number of unknown characteristic impedances Z.SELECTED DRAWING: Figure 1