首页> 外国专利> CHARACTERISTIC IMPEDANCE MEASURING SYSTEM AND CHARACTERISTIC IMPEDANCE MEASURING METHOD

CHARACTERISTIC IMPEDANCE MEASURING SYSTEM AND CHARACTERISTIC IMPEDANCE MEASURING METHOD

机译:特征阻抗测量系统及特征阻抗测量方法

摘要

PROBLEM TO BE SOLVED: To provide a characteristic impedance measuring system and its measuring method which can input a step pulse from a step pulse generator to an object to be measured, and reduce the difference from the characteristic impedance of the object to be measured caused by a measuring frequency of the characteristic impedance measured by using a clock pulse generator and calculated.;SOLUTION: The system has a device for controlling high frequency component included in the step pulse, delaying the rise speed of the step pulse and inputting in the object to be measured.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种特征阻抗测量系统及其测量方法,该系统和测量方法可以将来自阶跃脉冲发生器的阶跃脉冲输入到要测量的物体,并减小由测量物体引起的与被测物体的特征阻抗的差异。解决方案:该系统具有一个设备,用于控制步进脉冲中包含的高频分量,延迟步进脉冲的上升速度并输入到目标中COPYRIGHT:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006017606A

    专利类型

  • 公开/公告日2006-01-19

    原文格式PDF

  • 申请/专利权人 TOPPAN PRINTING CO LTD;

    申请/专利号JP20040196436

  • 发明设计人 OMORI HIROYASU;

    申请日2004-07-02

  • 分类号G01R27/02;H05K3/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:55:25

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号