首页> 外国专利> Memory devices that apply a programming potential to a memory cell in a string coupled to a source and data line concurrently with biasing the data line to a greater potential than the source

Memory devices that apply a programming potential to a memory cell in a string coupled to a source and data line concurrently with biasing the data line to a greater potential than the source

机译:在向源极和数据线耦合的字符串中向存储单元施加编程电位的存储器件,同时将数据线偏置到比源极更大的电位

摘要

A first string of memory cells, including a selected memory cell, and a second string of memory cells are coupled to a common data line and a common source. The data line is biased to a first potential greater than a second potential to which the source is biased and a select gate coupled between the second string of memory cells and the data line is deactivated during a programming operation performed on the selected memory cell. The programming operation includes applying a programming potential to a control gate of the selected memory cell concurrently with biasing the data line to the first potential and biasing the source to the second potential while the select gate is deactivated.
机译:包括所选存储单元的第一存储单元串和第二存储单元串耦合到公共数据线和公共源。在对所选存储单元执行的编程操作期间,将数据线偏置到大于被源极偏置到的第二电势的第一电势,并且停用在第二存储单元串与数据线之间耦合的选择栅。编程操作包括在将数据线偏置到第一电势的同时将编程电势施加到所选存储单元的控制栅,同时在选择栅被停用的同时将源极偏置到第二电势。

著录项

  • 公开/公告号US10049756B2

    专利类型

  • 公开/公告日2018-08-14

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US201715478312

  • 发明设计人 AKIRA GODA;YIJIE ZHAO;KRISHNA PARAT;

    申请日2017-04-04

  • 分类号G11C16/10;G11C16/34;G11C16/04;

  • 国家 US

  • 入库时间 2022-08-21 13:05:19

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