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Preparation methods of low temperature poly-silicon thin film and transistor and laser crystallization apparatus

机译:低温多晶硅薄膜的制备方法,晶体管及激光结晶装置

摘要

The invention provides a preparation method of a low temperature poly-silicon thin film, a preparation method of a low temperature poly-silicon thin film transistor, and a laser crystallization apparatus, and belongs to the technical field of display. The preparation method of a low temperature poly-silicon thin film of the invention comprises: forming an amorphous silicon thin film on a transparent substrate; and performing laser annealing on said amorphous silicon thin film from a side of said amorphous silicon thin film departing from said substrate, and performing laser irradiation from a side of said substrate departing from said amorphous silicon thin film, to form a low temperature poly-silicon thin film. The preparation method of a low temperature poly-silicon thin film of the invention may not only perform laser annealing on an amorphous silicon thin film form a side of the amorphous silicon thin film departing from the substrate, but also perform laser irradiation from a side of the substrate departing from the amorphous silicon thin film, and the temperature of the amorphous silicon thin film can be retained by performing laser irradiation from a side of the substrate departing from the amorphous silicon thin film. In this way, the crystallization period of poly-silicon may be elongated, and it is possible to obtain crystal grains with larger sizes, to increase carrier mobility, and to reduce drain current.
机译:本发明提供了一种低温多晶硅薄膜的制备方法,一种低温多晶硅薄膜晶体管的制备方法,以及一种激光晶化装置,属于显示器技术领域。本发明的低温多晶硅薄膜的制备方法包括:在透明基板上形成非晶硅薄膜;以及在非晶硅薄膜上形成非晶硅薄膜。从所述非晶硅薄膜的背离所述衬底的一侧对所述非晶硅薄膜进行激光退火,并从所述衬底的背离所述非晶硅薄膜的一侧进行激光辐照,以形成低温多晶硅薄膜。本发明的低温多晶硅薄膜的制备方法不仅可以在非晶硅薄膜的背离衬底的一侧上对非晶硅薄膜进行激光退火,而且可以从非晶硅薄膜的一侧进行激光照射。通过从基板的背离非晶硅薄膜的一侧进行激光照射,可以保持背离非晶硅薄膜的基板的温度,并且可以保持非晶硅薄膜的温度。以此方式,可以延长多晶硅的结晶时间,并且可以获得具有更大尺寸的晶粒,以增加载流子迁移率并减小漏极电流。

著录项

  • 公开/公告号US10049873B2

    专利类型

  • 公开/公告日2018-08-14

    原文格式PDF

  • 申请/专利权人 BOE TECHNOLOGY GROUP CO. LTD.;

    申请/专利号US201615228140

  • 发明设计人 XIAOWEI XU;XIAOLONG LI;

    申请日2016-08-04

  • 分类号H01L21/02;H01L21/67;H01L29/66;H01L29/786;B23K26;

  • 国家 US

  • 入库时间 2022-08-21 13:05:16

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